Analytical Characterization Facility Mission Statement
Analytical Characterization Facility Mission Statement
The BYU Analytical Characterization Facility advances research and education in the chemical and physical analysis of materials at the molecular, surface, and atomic levels. By providing access to advanced instrumentation, expert consultation, and training through coursework and workshops, we enable high-quality analytical characterization and equip students, faculty, and staff with the skills needed for impactful scientific work and long-term professional success.
Education and Training
The primary purpose of the Analytical Characterization Facility is to provide hands-on education and training in the theory and application of modern analytical techniques, including spectroscopy, separations, surface analysis, and atomic analysis to students. We offer graduate-level courses and periodic workshops open to all BYU students, faculty, and staff. These experiences equip users with practical skills and foundational knowledge that support both their academic work and future careers.
Research Support
The facility provides advanced instrumentation and expertise to support a wide range of analytical needs across campus. We collaborate with investigators and offer consultations to help design and execute projects involving chemical characterization, compositional analysis, surface properties, molecular identification and quantification.
Equipment Stewardship
We maintain and continuously improve our instrumentation to ensure reliable, high-quality performance. Through routine maintenance, timely service, and strategic upgrades, we ensure the facility meets current standards in research and education across diverse analytical platforms.
Professional Development
Facility personnel actively pursue professional development to remain current with emerging analytical techniques and technologies. This commitment ensures that users receive informed guidance and access to best practices in spectroscopy, separations science, surface characterization, and atomic-level analysis.